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Proceedings Paper

Metrological advantages of the light source based on optically connected integrating spheres
Author(s): Leonid Mikheenko; Volodymyr Borovytsky
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Paper Abstract

The paper presents the metrological analysis of the light sources which have a form of several optically connected integrating spheres. This light sources contain several (3 ... 11) primary integrating spheres of small diameters that are installed on a secondary integrating sphere of bigger diameter. The initial light sources – halogen lamps or light emitted diodes are installed inside the primary integrating spheres. These spheres are mounted on the secondary integrating sphere. The radiation comes from the primary integrating spheres to the secondary one through the diaphragms which diameters can be varied. It makes possible to control the total flux coming through the diaphragms and to set the required output radiance. The secondary integrating sphere has an output aperture where uniform radiance emits. The paper discusses the technique for calculation of the precision of the output radiance according to variations of optical and geometrical parameters of the light source. There are investigated influences of power supply, reflectance properties, diameters of internal surfaces of the integrating spheres and diameters of diaphragms between the integrating spheres. The precision of the output radiance is better than 1.9 % for the non-expensive light sources. For the high-quality light sources it can reach 0.7 %. The possible range of the output radiance is from 0 to 1 200 W/(st•m2). These facts confirm the sufficient metrological advantages of the proposed light sources for absolute radiometric measurements. The proposed light sources can be considered as one of the best candidates for calibration of the modern remote sensing instruments and high quality imaging systems working in optical range 0.4 – 2.2 μkm.

Paper Details

Date Published: 24 October 2012
PDF: 12 pages
Proc. SPIE 8511, Infrared Remote Sensing and Instrumentation XX, 851113 (24 October 2012); doi: 10.1117/12.928942
Show Author Affiliations
Leonid Mikheenko, National Technical Univ. of Ukraine "KPI" (Ukraine)
Volodymyr Borovytsky, National Technical Univ. of Ukraine "KPI" (Ukraine)

Published in SPIE Proceedings Vol. 8511:
Infrared Remote Sensing and Instrumentation XX
Marija Strojnik; Gonzalo Paez, Editor(s)

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