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Proceedings Paper

Achieving optimal flatness and surface roughness properties for novel x-ray optic structures formed by dicing saws
Author(s): Michael Wieczorek; Ruben Khachatryan; Yuri Shvyd'ko; Robert H. Smith; Kenichi Iwasaki; Suzanne Miller; Jun Qian; Xianrong Huang; Lahsen Assoufid
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Paper Abstract

Crystal-based x-ray optics are widely used in the synchrotron radiation field. Such optics include monochromators, channel-cut crystals, spectral analyzers, and phase plates that are generally made with standard fabrication tools such as grinders, ultrasonic mills, blade saws, and wire saws. However, modern synchrotron radiation instruments require more complicated and high-precision crystal structures that cannot be fabricated by these conventional tools. Examples include narrow channels and crystal cavities that require smooth and strain-free sidewalls or inner surfaces. Since it is extremely difficult to polish such surfaces by conventional means, specialized cutting tools are required to make the as-cut surfaces as smooth as possible. A possible way to obtain such smooth surfaces is to use a dicing saw as a fabrication tool - a tool typically used in the microelectronics industry to cut or dice semiconductor and other materials. Here we present our studies on the use of dicing saws for cutting innovative, monolithic, x-ray optic devices comprised of tall, narrow-standing, thin crystal-plate arrays. We report cutting parameters that include the rotational speed of the cutting blade (a.k.a. spindle speed), cutting speed (a.k.a. feed rate), number of passes for each cut depth (if required), and diamond grit size for producing the flattest and most smooth side walls. Blade type and construction (sintered, Ni, and resin) also play critical roles in achieving optimum results. The best experimental data obtained produced an average surface roughness of 49 nm and a peak-to-valley flatness of 3625 nm. By achieving these results, we have been able to assist experimenters in the synchrotron radiation field in their efforts to create functional and novel optical devices.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8502, Advances in X-Ray/EUV Optics and Components VII, 85020M (15 October 2012); doi: 10.1117/12.928369
Show Author Affiliations
Michael Wieczorek, Argonne National Lab. (United States)
Ruben Khachatryan, Argonne National Lab. (United States)
Yuri Shvyd'ko, Argonne National Lab. (United States)
Robert H. Smith, Advanced Dicing Technologies Ltd. (United States)
Kenichi Iwasaki, Disco Hi-Tec America, Inc. (United States)
Suzanne Miller, Argonne National Lab. (United States)
Jun Qian, Argonne National Lab. (United States)
Xianrong Huang, Argonne National Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 8502:
Advances in X-Ray/EUV Optics and Components VII
Shunji Goto; Christian Morawe; Ali M. Khounsary, Editor(s)

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