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Proceedings Paper

Improve Fourier transform profilometry by locally area modulating squared binary structured pattern
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Paper Abstract

Our recent study found that it is very difficult to use the binary defocusing technique to completely suppress the 3rd-order harmonics, and thus it is challenging to achieve high-quality three-dimensional (3-D) measurement with the Fourier transformation method. This paper presents a novel approach to effectively eliminate the 3rd order harmonics by modulating the binary structured patterns in both x and y directions. Both simulation and experimental results will be presented to verify the performance of the proposed technique.

Paper Details

Date Published: 13 September 2012
PDF: 6 pages
Proc. SPIE 8493, Interferometry XVI: Techniques and Analysis, 849312 (13 September 2012); doi: 10.1117/12.927439
Show Author Affiliations
William Lohry, Iowa State Univ. (United States)
Song Zhang, Iowa State Univ. (United States)

Published in SPIE Proceedings Vol. 8493:
Interferometry XVI: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers; Jan Burke, Editor(s)

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