
Proceedings Paper
Metal organic chemical vapor deposition and investigation of structural, optical and gas sensing characteristics of ZnO thin film grown on quartzFormat | Member Price | Non-Member Price |
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Paper Abstract
Nano-crystalline materials having large surface to volume ratio are promising candidates for gas sensor application. In
order to achieve this nano crystallinity ZnO thin film is deposited on the quartz substrate by Metal Organic Chemical
Vapor Deposition (MOCVD) technique. Diethyl-zinc (DEZn) and tert-butanol (TBOH) are used as the zinc and oxygen
precursors respectively. The film properties are analyzed by XRD, FESEM and UV-visible spectroscopy. X-ray
diffraction (XRD) studies showed that the film is textured along (002) plane. The FESEM images reveal the nano-size of
the particles. From the optical studies it is found that the film is transparent in nature and the band gap is 3.24 eV. The
gas sensing characteristics of the grown film is investigated in presence of CO gas as a function of temperature and gas
concentration. The sensing results show that MOCVD grown ZnO thin films can be used as attractive reducing gas
sensors.
Paper Details
Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 85490Z (15 October 2012); doi: 10.1117/12.927024
Published in SPIE Proceedings Vol. 8549:
16th International Workshop on Physics of Semiconductor Devices
Monica Katiyar; B. Mazhari; Y N Mohapatra, Editor(s)
PDF: 6 pages
Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 85490Z (15 October 2012); doi: 10.1117/12.927024
Show Author Affiliations
S. Pati, Indian Institute of Technology Kharagpur (India)
P. Banerji, Indian Institute of Technology Kharagpur (India)
P. Banerji, Indian Institute of Technology Kharagpur (India)
S. B. Majumder, Indian Institute of Technology Kharagpur (India)
Published in SPIE Proceedings Vol. 8549:
16th International Workshop on Physics of Semiconductor Devices
Monica Katiyar; B. Mazhari; Y N Mohapatra, Editor(s)
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