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Proceedings Paper

0.4um high voltage CMOS smart power technology: 120V LD NMOS for integrated system on chip applications
Author(s): Nayan Patel
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Paper Abstract

In this work, we demonstrate best in class 120V Lateral Drain NMOS devices using 0.4um CMOS technology. These devices are fabricated with just 1 additional mask to the baseline CMOS process flow. 2D TCAD simulations were first carried out to identify the device with best breakdown voltage (BVdss) and specific on resistance (Rsp) combination. Then, a Design of Experiment (DOE) in layout was carried out around the best simulated device for different geometries (channel, Drain Extension and Field plate lengths). Rsp as low as 244 mohm-mm2 is achieved for a BVdss of 177V. This is more than 35% improvement over the best device reported in the industry so far [1]. Increasing channel length helps in improving the full bias stability of the device, albeit at the cost of Rsp. However, Rsp still remains lower than present industry state of the art.

Paper Details

Date Published: 15 October 2012
PDF: 4 pages
Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 85490R (15 October 2012); doi: 10.1117/12.926994
Show Author Affiliations
Nayan Patel, Cypress Semiconductor Technology India Pvt Ltd. (India)

Published in SPIE Proceedings Vol. 8549:
16th International Workshop on Physics of Semiconductor Devices
Monica Katiyar; B. Mazhari; Y N Mohapatra, Editor(s)

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