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Proceedings Paper

Geometrical model fitting for interferometric data: GEM-FIND
Author(s): Daniela Klotz; Stephane Sacuto; Claudia Paladini; Josef Hron; Georg Wachter
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Paper Abstract

We developed the tool GEM-FIND that allows to constrain the morphology and brightness distribution of ob- jects. The software fits geometrical models to spectrally dispersed interferometric visibility measurements in the N-band using the Levenberg-Marquardt minimization method. Each geometrical model describes the bright- ness distribution of the object in the Fourier space using a set of wavelength-independent and/or wavelength- dependent parameters. In this contribution we numerically analyze the stability of our nonlinear fitting approach by applying it to sets of synthetic visibilities with statistically applied errors, answering the following questions: How stable is the parameter determination with respect to (i) the number of uv-points, (ii) the distribution of points in the uv-plane, (iii) the noise level of the observations?

Paper Details

Date Published: 12 September 2012
PDF: 14 pages
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451A (12 September 2012); doi: 10.1117/12.925881
Show Author Affiliations
Daniela Klotz, Univ. of Vienna (Austria)
Stephane Sacuto, Uppsala Univ. (Sweden)
Claudia Paladini, Univ. of Vienna (Austria)
Josef Hron, Univ. of Vienna (Austria)
Georg Wachter, Vienna Univ. of Technology (Austria)


Published in SPIE Proceedings Vol. 8445:
Optical and Infrared Interferometry III
Françoise Delplancke; Jayadev K. Rajagopal; Fabien Malbet, Editor(s)

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