
Proceedings Paper
Rapid electro-optical (EO) TPS development in a military environmentFormat | Member Price | Non-Member Price |
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Paper Abstract
Santa Barbara Infrared, Inc. has deployed IRWindows as an Electro-Optical test development and execution
environment for military Test Program Sets (TPS). Advantages of TPS development for EO systems in the
IRWindows environment are seen compared to the TPS development in ATLAS. The advantages of the IRWindows
environment are:
1. Faster learning curve (graphical user interface is easier than test line interface)
2. Faster TPS development time (real time changes and asset control interface allows for faster development)
3. Asset control panel allows user to control assets real time and monitor all asset functions during development
4. Unit Under Test (UUT) image viewer allows user to set test parameters like Region of Interest more easily and
more precisely
5. Continuous mode tests (like MTF allows user to real time adjustments)
6. Open architecture for test modifications
This paper will outline the details of how these advantages are utilized and how not only development time is
decreased but also how test execution time can be minimized making traditionally long TPS run times on EO systems
more efficient.
Paper Details
Date Published: 18 May 2012
PDF: 8 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83550C (18 May 2012); doi: 10.1117/12.924992
Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)
PDF: 8 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83550C (18 May 2012); doi: 10.1117/12.924992
Show Author Affiliations
James McKechnie, Santa Barbara Infrared, Inc. (United States)
Alan Irwin, Santa Barbara Infrared, Inc. (United States)
Alan Irwin, Santa Barbara Infrared, Inc. (United States)
Thomas Gauntner, U.S. Army Armament Research, Development and Engineering Ctr. (United States)
Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)
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