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Proceedings Paper

Evaluation of an extensive speckle measurement method
Author(s): Stijn Roelandt; Youri Meuret; Gordon Craggs; Guy Verschaffelt; Peter Janssens; Hugo Thienpont
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Paper Abstract

The introduction of lasers for projection applications is hampered by the emergence of speckle. In order to evaluate the speckle distorted image quality, it is important to devise an objective way to measure the amount of speckle. Mathematically, speckle can be described by its speckle contrast value C, which is given by the ratio between the standard deviation of the intensity fluctuations and the mean intensity. Because the measured speckle contrast strongly depends on the parameters of the measurement setup, in this paper we propose a standardized procedure to measure the amount of speckle in laser based projection systems. To obtain such a procedure, the influence of relevant measurement set-up parameters is investigated. The resulting measurement procedure consists of a single digital image sensor in combination with a camera lens. The parameters of the camera lens are chosen such that the measured speckle contrast values correspond with the subjective speckle perception of a human observer, independent of the projector's speckle reduction mechanism(s). Finally, the speckle measurement procedure was performed with different cameras and the results were compared.

Paper Details

Date Published: 30 April 2012
PDF: 7 pages
Proc. SPIE 8436, Optics, Photonics, and Digital Technologies for Multimedia Applications II, 843603 (30 April 2012); doi: 10.1117/12.922197
Show Author Affiliations
Stijn Roelandt, Vrije Univ. Brussel (Belgium)
Youri Meuret, Vrije Univ. Brussel (Belgium)
Gordon Craggs, Vrije Univ. Brussel (Belgium)
Guy Verschaffelt, Vrije Univ. Brussel (Belgium)
Peter Janssens, Barco - Technology Ctr. (Belgium)
Hugo Thienpont, Vrije Univ. Brussel (Belgium)

Published in SPIE Proceedings Vol. 8436:
Optics, Photonics, and Digital Technologies for Multimedia Applications II
Peter Schelkens; Touradj Ebrahimi; Gabriel Cristóbal; Frédéric Truchetet; Pasi Saarikko, Editor(s)

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