Proceedings Paper
The features of x-ray topographic contrast formation in silicon with dislocation clusters| Format | Member Price | Non-Member Price |
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Paper Abstract
The features of formation of diffraction images of edge dislocation sets forming clusters (of two, three and more dislocations)
as well as small-angle dislocation boundaries (walls) were studied. Various intensity interference effects of rescattering
and internal reflection of the newly formed and already existing wave fields on thickness distributions of intensity for the
case of presence in the same glide plane of edge dislocations with parallel and anti-parallel Burgers vectors were
discovered.
Paper Details
Date Published: 22 November 2011
PDF: 8 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83381B (22 November 2011); doi: 10.1117/12.920984
Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)
PDF: 8 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83381B (22 November 2011); doi: 10.1117/12.920984
Show Author Affiliations
Igor M. Fodchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Sergiy M. Novikov, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Sergiy M. Novikov, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Andriy Ya. Struk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)
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