
Proceedings Paper
Analysis of influence of plane-parallel plate on resolving power of Fourier spectrometerFormat | Member Price | Non-Member Price |
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Paper Abstract
The characteristics of Fourier spectrometer including light-gathering power and resolving power are studied through
simulation of the main stages of operation of this device. Such Fourier spectrometer provides the study of spectra of
absorbtion, radiation or reflection of liquds or gases into cuvette manufactured from the known grade of glass or other
transparent material. In its turn, the material of cuvette causes some changes into optical path differences between interfereing
beams due to dispersion. We consider the influence of plane-parallel plate as the axial disperse element on the
resolving power of Fourier spectrometer as such element is placed into one leg of an interferometer. Dependences of
spectral distribution of radiation are found out with and without influence of plane-parallel plate. We also compare the
influence of plane-parallel plate and the range of displacement of moving mirror on resolving power of Fourier spectrometer.
Scheme for control of piezo-mirror displaced by sevelal wavelengths has been introduced. The results of theorecical
consideration and experiments lead to the following conclusion: as refraction index of the cuvette material increases,
as resolving power decreases; but this shortcoming can be compensated by increasing range of modulation of moving
mirror.
Paper Details
Date Published: 22 November 2011
PDF: 12 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83380J (22 November 2011); doi: 10.1117/12.920575
Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)
PDF: 12 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83380J (22 November 2011); doi: 10.1117/12.920575
Show Author Affiliations
G. V. Bogatyryova, National Technical Univ. of Ukraine (Ukraine)
D. Yu. Kondratenko, National Technical Univ. of Ukraine (Ukraine)
Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)
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