
Proceedings Paper
The equivalence of 2DLPP to LPP and (2D)2LPP for face recognitionFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
2DLPP is a valid dimensions reduction method which directly extracts feature from image matrix and can detect the
intrinsic manifold structure of data by preserving the local information of training data. We analyze the relation between
2DLPP and LPP. We demonstrate they are equivalent on some special conditions. Conventional 2DLPP is working in
the row direction of images. We proposed an alternative 2DLPP which is working in the column direction of images. By
simultaneously considering the row and column directions, we develop the two-directional 2DLPP, i.e. (2D)2LPP. The
proposed method not only extracts feature with lower dimension than 2DLPP, but also take full advantage of row and
column structure information of images. Experiment results on two standard face databases demonstrate the
effectiveness of the proposed method.
Paper Details
Date Published: 13 January 2012
PDF: 7 pages
Proc. SPIE 8350, Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies, 83501O (13 January 2012); doi: 10.1117/12.920530
Published in SPIE Proceedings Vol. 8350:
Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies
Safaa S. Mahmoud; Zhu Zeng; Yuting Li, Editor(s)
PDF: 7 pages
Proc. SPIE 8350, Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies, 83501O (13 January 2012); doi: 10.1117/12.920530
Show Author Affiliations
Jun Yang, Sichuan Normal Univ. (China)
Yanli Liu, Sichuan Normal Univ. (China)
Published in SPIE Proceedings Vol. 8350:
Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies
Safaa S. Mahmoud; Zhu Zeng; Yuting Li, Editor(s)
© SPIE. Terms of Use
