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Proceedings Paper

Polarimetric wavelet fractal remote sensing principles for space materials
Author(s): George C. Giakos; Richard H. Picard; Phan D. Dao; Peter N. Crabtree; Patrick J. McNicholl; Jeff Petermann; Suman Shrestha; Chaya Narayan; Stefanie Marotta
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Paper Abstract

A new remote sensing approach based on polarimetric wavelet fractal detection principles is introduced and the Mueller matrix formalism is defined, aimed at enhancing the detection, identification, characterization, and discrimination of unresolved space objects at different aspect angles. The design principles of a multifunctional liquid crystal monostatic polarimetric ladar are introduced and related to operating conditions and system performance metrics. Backscattered polarimetric signal contributions from different space materials were detected using a laboratory ladar testbed, and then analyzed using techniques based on wavelets and fractals. The depolarization, diattenuation, and retardance of the materials were estimated using Mueller matrix decomposition for different aspect angles. The outcome of this study indicates that polarimetric fractal wavelet principles may enhance the capabilities of the ladar to provide characterization and discrimination of unresolved space objects.

Paper Details

Date Published: 8 June 2012
PDF: 12 pages
Proc. SPIE 8364, Polarization: Measurement, Analysis, and Remote Sensing X, 836405 (8 June 2012); doi: 10.1117/12.920487
Show Author Affiliations
George C. Giakos, The Univ. of Akron (United States)
Richard H. Picard, ARCON Corp. (United States)
Phan D. Dao, U.S. Air Force Research Lab. (United States)
Peter N. Crabtree, U.S. Air Force Research Lab. (United States)
Patrick J. McNicholl, U.S. Air Force Research Lab. (United States)
Jeff Petermann, The Univ. of Akron (United States)
Suman Shrestha, The Univ. of Akron (United States)
Chaya Narayan, The Univ. of Akron (United States)
Stefanie Marotta, The Univ. of Akron (United States)


Published in SPIE Proceedings Vol. 8364:
Polarization: Measurement, Analysis, and Remote Sensing X
David B. Chenault; Dennis H. Goldstein, Editor(s)

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