
Proceedings Paper
Terahertz imaging with missing data analysis for metamaterials characterizationFormat | Member Price | Non-Member Price |
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Paper Abstract
Terahertz imaging proves advantageous for metamaterials characterization since the interaction of THz radiation with
the metamaterials produces clear patterns of the material. Characteristic "finger prints" of the crystal structure help
locating defects, dislocations, contamination, etc. TDS-THz spectroscopy is one of the tools to control metamaterials
design and manufacturing. A computational technique is suggested that provides a reliable way of calculation of the
metamaterials structure parameters, spotting defects. Based on missing data analysis, the applied signal processing
facilitates a better quality image while compensating for partially absent information. Results are provided.
Paper Details
Date Published: 9 May 2012
PDF: 12 pages
Proc. SPIE 8363, Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense, 83630X (9 May 2012); doi: 10.1117/12.920183
Published in SPIE Proceedings Vol. 8363:
Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense
A. F. Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)
PDF: 12 pages
Proc. SPIE 8363, Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense, 83630X (9 May 2012); doi: 10.1117/12.920183
Show Author Affiliations
Andre Sokolnikov, Visual Solutions and Applications (United States)
Published in SPIE Proceedings Vol. 8363:
Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense
A. F. Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)
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