
Proceedings Paper
Solution-processed colloidal quantum dot photodiodes for low-cost SWIR imagingFormat | Member Price | Non-Member Price |
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Paper Abstract
While InGaAs-based focal plane arrays (FPAs) provide excellent detectivity and low noise for SWIR imaging
applications, wider scale adoption of systems capable of working in this spectral range is limited by high
costs, limited spectral response, and costly integration with Si ROIC devices. RTI has demonstrated a novel
photodiode technology based on IR-absorbing solution-processed PbS colloidal quantum dots (CQD) that can
overcome these limitations of InGaAs FPAs. We have fabricated devices with quantum efficiencies
exceeding 50%, and detectivities that are competitive with that of InGaAs. Dark currents of ~2 nA/cm2 were
measured at temperatures compatible with solid state coolers. Additionally, by processing these devices
entirely at room temperature we find them to be compatible with monolithic integration onto readout ICs,
thereby removing any limitation on device size. We will show early efforts towards demonstrating a direct
integration of this sensor technology onto a Si ROIC IC and describe a path towards fabricating sensors
sensitive from the visible to 2200 nm at a cost comparable to that of CMOS based devices. This combination
of high performance, dramatic cost reduction, and multispectral sensitivity is ideally suited to expand the use
of SWIR imaging in current applications, as well as to address applications which require a multispectral
sensitivity not met by existing technologies.
Paper Details
Date Published: 31 May 2012
PDF: 8 pages
Proc. SPIE 8353, Infrared Technology and Applications XXXVIII, 835337 (31 May 2012); doi: 10.1117/12.919308
Published in SPIE Proceedings Vol. 8353:
Infrared Technology and Applications XXXVIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)
PDF: 8 pages
Proc. SPIE 8353, Infrared Technology and Applications XXXVIII, 835337 (31 May 2012); doi: 10.1117/12.919308
Show Author Affiliations
Ethan J. D. Klem, RTI International (United States)
Jay Lewis, RTI International (United States)
Christopher Gregory, RTI International (United States)
Jay Lewis, RTI International (United States)
Christopher Gregory, RTI International (United States)
Published in SPIE Proceedings Vol. 8353:
Infrared Technology and Applications XXXVIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)
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