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Proceedings Paper

Patch-based local turbulence compensation in anisoplanatic conditions
Author(s): Adam W. M. van Eekeren; Maarten C. Kruithof; Klamer Schutte; Judith Dijk; Miranda van Iersel; Piet B. W. Schwering
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Paper Abstract

Infrared imagery over long ranges is hampered by atmospheric turbulence effects, leading to spatial resolutions worse than expected by a diffraction limited sensor system. This diminishes the recognition range and it is therefore important to compensate visual degradation due to atmospheric turbulence. The amount of turbulence is spatially varying due to anisoplanatic conditions, while the isoplanatic angle varies with atmospheric conditions. But also the amount of turbulence varies significantly in time. In this paper a method is proposed that performs turbulence compensation using a patch-based approach. In each patch the turbulence is considered to be approximately spatially and temporally constant. Our method utilizes multi-frame super-resolution, which incorporates local registration, fusion and deconvolution of the data and also can increase the resolution. This makes our method especially suited to use under anisoplanatic conditions. In our paper we show that our method is capable of compensating the effects of mild to strong turbulence conditions.

Paper Details

Date Published: 18 May 2012
PDF: 8 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83550T (18 May 2012); doi: 10.1117/12.918545
Show Author Affiliations
Adam W. M. van Eekeren, TNO Defense, Safety and Security (Netherlands)
Maarten C. Kruithof, TNO Defense, Safety and Security (Netherlands)
Klamer Schutte, TNO Defense, Safety and Security (Netherlands)
Judith Dijk, TNO Defense, Safety and Security (Netherlands)
Miranda van Iersel, TNO Defense, Safety and Security (Netherlands)
Piet B. W. Schwering, TNO Defense, Safety and Security (Netherlands)

Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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