Share Email Print
cover

Proceedings Paper

Spectral-feature-based analysis of reflectance and emission spectral libraries and imaging spectrometer data
Author(s): Fred A. Kruse
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This research demonstrates the application of spectral-feature-based analysis to identifying and mapping Earth-surface materials using spectral libraries and imaging spectrometer data. Feature extraction utilizing a continuum-removal and local minimum detection approach was tested for analysis of both reflectance and emissivity spectral libraries by extracting and characterizing spectral features of rocks, soils, minerals, and man-made materials. Library-derived information was then used to illustrate both reflectance- and emissivity-feature-based spectral mapping using imaging spectrometer data (AVIRIS and SEBASS). An additional spectral library of emission spectra from selected nocturnal lighting types was used to develop a database of key spectral features that allowed mapping and characterization of night lights from ProSpecTIR-VS imaging spectrometer data. Results from these case histories demonstrate that the spectralfeature- based approach can be used with either reflectance or emission spectra and applied to a wide variety of imaging spectrometer data types for extraction of key surface composition information.

Paper Details

Date Published: 24 May 2012
PDF: 10 pages
Proc. SPIE 8390, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVIII, 83901F (24 May 2012); doi: 10.1117/12.918233
Show Author Affiliations
Fred A. Kruse, Naval Postgraduate School (United States)


Published in SPIE Proceedings Vol. 8390:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVIII
Sylvia S. Shen; Paul E. Lewis, Editor(s)

© SPIE. Terms of Use
Back to Top