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Proceedings Paper

The application of compressed sensing to long-term acoustic emission-based structural health monitoring
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Paper Abstract

The acoustic emission (AE) phenomena generated by a rapid release in the internal stress of a material represent a promising technique for structural health monitoring (SHM) applications. AE events typically result in a discrete number of short-time, transient signals. The challenge associated with capturing these events using classical techniques is that very high sampling rates must be used over extended periods of time. The result is that a very large amount of data is collected to capture a phenomenon that rarely occurs. Furthermore, the high energy consumption associated with the required high sampling rates makes the implementation of high-endurance, low-power, embedded AE sensor nodes difficult to achieve. The relatively rare occurrence of AE events over long time scales implies that these measurements are inherently sparse in the spike domain. The sparse nature of AE measurements makes them an attractive candidate for the application of compressed sampling techniques. Collecting compressed measurements of sparse AE signals will relax the requirements on the sampling rate and memory demands. The focus of this work is to investigate the suitability of compressed sensing techniques for AE-based SHM. The work explores estimating AE signal statistics in the compressed domain for low-power classification applications. In the event compressed classification finds an event of interest, ι1 norm minimization will be used to reconstruct the measurement for further analysis. The impact of structured noise on compressive measurements is specifically addressed. The suitability of a particular algorithm, called Justice Pursuit, to increase robustness to a small amount of arbitrary measurement corruption is investigated.

Paper Details

Date Published: 30 March 2012
PDF: 12 pages
Proc. SPIE 8346, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2012, 834619 (30 March 2012); doi: 10.1117/12.917381
Show Author Affiliations
Alessandro Cattaneo, Politecnico di Milano (Italy)
Gyuhae Park, Los Alamos National Lab. Engineering Institute (United States)
Charles Farrar, Los Alamos National Lab. Engineering Institute (United States)
David Mascareñas, Los Alamos National Lab. Engineering Institute (United States)

Published in SPIE Proceedings Vol. 8346:
Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2012
Theodore E. Matikas, Editor(s)

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