Share Email Print

Proceedings Paper

Integrated framework for jitter analysis combining disturbance, structure, vibration isolator and optical model
Author(s): Dae-Oen Lee; Jae-San Yoon; Jae-Hung Han
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Micro-vibration induced by actuating components of the satellite can severely degrade the optical performance of high precision observation satellites. In this paper, an integrated analysis framework combining disturbance, structure, vibration isolator and optical system model is developed for evaluating the performance of optical payloads in the presence of micro-vibration, and the effectiveness of using a vibration isolator for performance enhancement. Reaction wheel generated disturbance, usually the largest anticipated disturbance, is modeled including the disturbances' interaction with the structural modes of the wheel. For structure modeling, a finite element program is used to solve for eigenvalues and eigenvectors of a structure model which are then used to create a state space model in modal form. A vibration isolator model capturing dynamics of an active isolator utilizing piezoelectric based actuator and load cell for feedback control is included to reduce the transmission of reaction wheel disturbances to the base structure. Dynamic response of the structure to reaction wheel disturbances is calculated with and without vibration isolator. The resulting jitter is used to obtain modulation transfer function (MTF) of diffraction limited optical system model, and the obtained MTF is used as spatial frequency filter for image simulation.

Paper Details

Date Published: 27 March 2012
PDF: 8 pages
Proc. SPIE 8341, Active and Passive Smart Structures and Integrated Systems 2012, 834126 (27 March 2012); doi: 10.1117/12.915428
Show Author Affiliations
Dae-Oen Lee, KAIST (Korea, Republic of)
Jae-San Yoon, KAIST (Korea, Republic of)
Jae-Hung Han, KAIST (Korea, Republic of)

Published in SPIE Proceedings Vol. 8341:
Active and Passive Smart Structures and Integrated Systems 2012
Henry A. Sodano, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?