Proceedings Paper
Kerr effect in structured superluminal media| Format | Member Price | Non-Member Price |
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Paper Abstract
Kerr effect accounts for the change in refractive index of a material with the light intensity and appears in all known
optical materials. In this work we analyze Kerr effect in structured superluminal media (e.g some specific types of
resonators). We show that Kerr effect in these structures can be cancelled or even reversed (in comparison with the Kerr
effect of the material composing the structure) depending on the group index of the structure. We also discuss some
possible realizations of structured superluminal media.
Paper Details
Date Published: 8 February 2012
PDF: 6 pages
Proc. SPIE 8273, Advances in Slow and Fast Light V, 827310 (8 February 2012);
Published in SPIE Proceedings Vol. 8273:
Advances in Slow and Fast Light V
Selim M. Shahriar; Frank A. Narducci, Editor(s)
PDF: 6 pages
Proc. SPIE 8273, Advances in Slow and Fast Light V, 827310 (8 February 2012);
Show Author Affiliations
X. Angulo-Vinuesa, Univ. de Alcalá (Spain)
Consejo Superior de Investigaciones Científicas (Spain)
S. Martin-López, Consejo Superior de Investigaciones Científicas (Spain)
C. Caucheteur, Univ. de Mons (Belgium)
D. Kinet, Univ. de Mons (Belgium)
M. Wuilpart, Univ. de Mons (Belgium)
Consejo Superior de Investigaciones Científicas (Spain)
S. Martin-López, Consejo Superior de Investigaciones Científicas (Spain)
C. Caucheteur, Univ. de Mons (Belgium)
D. Kinet, Univ. de Mons (Belgium)
M. Wuilpart, Univ. de Mons (Belgium)
A. Denisov, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
S. H. Chin, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
L. Thévenaz, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
M. González-Herráez, Univ. de Alcalá (Spain)
S. H. Chin, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
L. Thévenaz, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
M. González-Herráez, Univ. de Alcalá (Spain)
Published in SPIE Proceedings Vol. 8273:
Advances in Slow and Fast Light V
Selim M. Shahriar; Frank A. Narducci, Editor(s)
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