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Proceedings Paper

Damage identification using substructural virtual distortion method
Author(s): Qingxia Zhang; Lukasz Jankowski; Zhongdong Duan
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Paper Abstract

This paper presents a Substructure Virtual Distortion Method (SVDM) for damage identification based on Virtual Distortion Method (VDM). VDM is a fast structural reanalysis method by introducing virtual distortions to simulate structural damages. SVDM extends the virtual distortions regard to the damaged elements to the related substructures. Such that the required number of virtual distortions depends on the substructure other than the elements, which reduces the computational work a lot. In addition, for a structure under a certain external force, the dynamic responses may be reflected by a few of main eigenvectors, and thus it only needs to compute the virtual distortions which are relative with these main eigenvectors. This further reduces the computational work. In this paper, first the relation among the virtual distortions of the substructure, actual distortions, and the substructure damage extents are derived; then the main distortions of the substructure are chosen by the contribution analysis of the distortions to the structural responses. In this way, the damages are optimized and identified by minimizing the least square distance between the measured response and the estimated response. A numerical frame model is used to verify the proposed method.

Paper Details

Date Published: 6 April 2012
PDF: 7 pages
Proc. SPIE 8345, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012, 83453X (6 April 2012); doi: 10.1117/12.915126
Show Author Affiliations
Qingxia Zhang, Dalian Nationalities Univ. (China)
Institute of Fundamental Technological Research (Poland)
Lukasz Jankowski, Institute of Fundamental Technological Research (Poland)
Zhongdong Duan, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 8345:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012
Masayoshi Tomizuka; Chung-Bang Yun; Jerome P. Lynch, Editor(s)

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