Share Email Print

Proceedings Paper

Structural and optical properties of LuFeO3 thin films prepared on silicon (100) substrate by pulsed laser deposition
Author(s): Liping Zhu; Hongmei Deng; Jianjun Tian; Pingxiong Yang; Junhao Chu
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The LuFeO3 (LFO) nanocrystalline films with the average grain size of 20 nm have been grown on silicon (100) substrates by pulsed laser deposition. X-ray diffraction (XRD) analysis shows that LFO films are polycrystalline. The microstructure and surface morphology of LFO film are analyzed by Atomic force microscope (AFM) and the surface shows the film is compact. Spectroscopic ellipsometry (SE) was used to extract the optical properties of LFO films in the 1.1-3.1 eV (400-1100 nm) photon energy range at room temperature. By fitting the measured ellipsometric parameter data with a multilayer model system for the LFO thin films, the optical constants and thicknesses of the thin films have been obtained. The refractive index n and extinction coefficient k of the LFO thin films both decreases with increasing thickness.

Paper Details

Date Published: 22 February 2012
PDF: 5 pages
Proc. SPIE 8333, Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Devices and Integration, 83331F (22 February 2012); doi: 10.1117/12.914548
Show Author Affiliations
Liping Zhu, East China Normal Univ. (China)
Hongmei Deng, Shanghai Univ. (China)
Jianjun Tian, East China Normal Univ. (China)
Pingxiong Yang, East China Normal Univ. (China)
Junhao Chu, East China Normal Univ. (China)

Published in SPIE Proceedings Vol. 8333:
Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Devices and Integration
Erich Kasper; Jinzhong Yu; Xun Li; Xinliang Zhang; Jinsong Xia; Junhao Chu; Zhijiang Dong; Bin Hu; Yan Shen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?