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Proceedings Paper

CT performance as a variable function of resolution, noise, and task property for iterative reconstructions
Author(s): Baiyu Chen; Samuel Richard; Olav Christianson; Xiaodong Zhou; Ehsan Samei
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Paper Abstract

The increasing availability of iterative reconstruction (IR) algorithms on clinical scanners is creating a demand for effectively and efficiently evaluating imaging performance and potential dose reduction. In this study, the location- and task-specific evaluation was performed using detectability index (d') by combining a task function, the task transfer function (TTF), and the noise power spectrum (NPS). Task function modeled a wide variety detection tasks in terms of shape and contrast. The TTF and NPS were measured from a physical phantom as a function of contrast and dose levels. Measured d' values were compared between three IRs (IRIS, SAFIRE3 and SAFIRE5) and conventional filtered back-projection (FBP) at various dose levels, showing an equivalent performance of IR at lower dose levels. AUC further calculated from d' showed that compared to FBP, SAFIRE5 may reduce dose by up to 50-60%; SAFIRE3 and IRIS by up to 20-30%. This study provides an initial framework for the localized and task-specific evaluation of IRs in CT and a guideline for the identification of optimal operating dose point with iterative reconstructions.

Paper Details

Date Published: 23 February 2012
PDF: 6 pages
Proc. SPIE 8313, Medical Imaging 2012: Physics of Medical Imaging, 83131K (23 February 2012); doi: 10.1117/12.913220
Show Author Affiliations
Baiyu Chen, Duke Univ. (United States)
Duke Univ. School of Medicine (United States)
Samuel Richard, Duke Univ. School of Medicine (United States)
Olav Christianson, Duke Univ. School of Medicine (United States)
Xiaodong Zhou, Siemens Medical Solutions USA, Inc. (United States)
Ehsan Samei, Duke Univ. School of Medicine (United States)
Duke Univ. (United States)

Published in SPIE Proceedings Vol. 8313:
Medical Imaging 2012: Physics of Medical Imaging
Norbert J. Pelc; Robert M. Nishikawa; Bruce R. Whiting, Editor(s)

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