In order to extract accurate phase changes due to deformation, the phase-shifting methods have been extensively investigated and applied to many practical measurements because of its simplicity and high resolution. But it requires that several specklegrams be captured in the static, non-deforming, condition of an object, making it unsuitable for measuring continuously deforming objects. Then we developed the method which does not require specklegram in static condition and can measure a large continuous-deformation with high accuracy. But this method was applied to deformation measurement of only one direction. We have improved this method and have obtained the new method which can measure deformation along two directions by using two lasers and one color camera. In addition, the method has potential to measure deformation along three directions: two in-planes and one out-of-plane.

Date Published: 11 October 2011
PDF: 10 pages
Proc. SPIE 8306, Photonics, Devices, and Systems V, 83060C (11 October 2011); doi: 10.1117/12.912076

Published in SPIE Proceedings Vol. 8306:
Photonics, Devices, and Systems V
Pavel Tománek; Dagmar Senderáková; Petr Páta, Editor(s)