
Proceedings Paper
1060nm VCSEL development at Furukawa for parallel optical interconnectFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper reviews research and development of 1060nm VCSELs at Furukawa Electric. We pursue the simultaneous
realization of three strong demands for low power consumption, high reliability, and high speed. For this purpose, we
have chosen compressively strained InGaAs/GaAs active layers emitting in a 1060 nm wavelength range because of their
advantages of lower threshold voltage, smaller defect propagation velocity, and larger material differential gain,
compared to those of GaAs/AlGaAs active layers widely used in 850 nm VCSELs. Oxide-confined and double intracavity
structures provide low and stable electrical resistance as well as low optical loss. The developed VCSELs
exhibited low threshold currents of 0.31 mA at 25 °C and 0.56 mA at 90 °C, together with highly uniform slope
efficiency distributions throughout a wafer. We also demonstrated 10 Gbps error free transmission at a very low bias
current of 1.4 mA, yielding low power dissipation operation of 0.14 mW/Gbps. Clear eye openings up to 20 Gbps were
confirmed at a low bias current of 3mA. A series of endurance tests and accelerated aging tests on nearly 5000 VCSELs
have proved Telcordia qualified high reliability and a very low failure rate of 30 FIT/channel at an operating temperature
of 40 °C and a bias current of 6mA, with a 90% confidential level.
Paper Details
Date Published: 7 February 2012
PDF: 8 pages
Proc. SPIE 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760F (7 February 2012); doi: 10.1117/12.912054
Published in SPIE Proceedings Vol. 8276:
Vertical-Cavity Surface-Emitting Lasers XVI
Chun Lei; Kent D. Choquette, Editor(s)
PDF: 8 pages
Proc. SPIE 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760F (7 February 2012); doi: 10.1117/12.912054
Show Author Affiliations
Masaki Funabashi, Furukawa Electric Co., Ltd. (Japan)
Suguru Imai, Furukawa Electric Co., Ltd. (Japan)
Keishi Takaki, Furukawa Electric Co., Ltd. (Japan)
Shinichi Kamiya, Furukawa Electric Co., Ltd. (Japan)
Hitoshi Shimizu, Furukawa Electric Co., Ltd. (Japan)
Yasumasa Kawakita, Furukawa Electric Co., Ltd. (Japan)
Suguru Imai, Furukawa Electric Co., Ltd. (Japan)
Keishi Takaki, Furukawa Electric Co., Ltd. (Japan)
Shinichi Kamiya, Furukawa Electric Co., Ltd. (Japan)
Hitoshi Shimizu, Furukawa Electric Co., Ltd. (Japan)
Yasumasa Kawakita, Furukawa Electric Co., Ltd. (Japan)
Koji Hiraiwa, Furukawa Electric Co., Ltd. (Japan)
Junji Yoshida, Furukawa Electric Co., Ltd. (Japan)
Toshihito Suzuki, Furukawa Electric Co., Ltd. (Japan)
Takuya Ishikawa, Furukawa Electric Co., Ltd. (Japan)
Naoki Tsukiji, Furukawa Electric Co., Ltd. (Japan)
Akihiko Kasukawa, Furukawa Electric Co., Ltd. (Japan)
Junji Yoshida, Furukawa Electric Co., Ltd. (Japan)
Toshihito Suzuki, Furukawa Electric Co., Ltd. (Japan)
Takuya Ishikawa, Furukawa Electric Co., Ltd. (Japan)
Naoki Tsukiji, Furukawa Electric Co., Ltd. (Japan)
Akihiko Kasukawa, Furukawa Electric Co., Ltd. (Japan)
Published in SPIE Proceedings Vol. 8276:
Vertical-Cavity Surface-Emitting Lasers XVI
Chun Lei; Kent D. Choquette, Editor(s)
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