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Proceedings Paper

Selecting the polarization in silicon photonic wire components
Author(s): Dan-Xia Xu; André Delâge; Jens H. Schmid; Rubin Ma; Shurui Wang; Jean Lapointe; Martin Vachon; Pavel Cheben; Siegfried Janz
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Paper Abstract

Silicon photonic wire waveguides are usually highly birefringent, so they are generally designed to operate for one particular polarization. For commonly used waveguides with a silicon thickness of 220 nm, TE polarization is preferred since TM is only weakly guided. For waveguides with a silicon thickness larger than 250 nm, both TE and TM polarizations have been employed. Overall, the choice of polarization has largely appeared arbitrary. In this presentation we review the pertinent polarization-dependent waveguide properties, including losses, back-reflection, polarization conversion and fabrication tolerances, with the intent to suggest guidelines for choosing the proper polarization. Through experimental evidence, we show that TM polarization has several important advantages and can support high performance resonators with a radius down to 2 μm.

Paper Details

Date Published: 2 February 2012
PDF: 9 pages
Proc. SPIE 8266, Silicon Photonics VII, 82660G (2 February 2012); doi: 10.1117/12.911368
Show Author Affiliations
Dan-Xia Xu, National Research Council Canada (Canada)
André Delâge, National Research Council Canada (Canada)
Jens H. Schmid, National Research Council Canada (Canada)
Rubin Ma, National Research Council Canada (Canada)
Shurui Wang, National Research Council Canada (Canada)
Jean Lapointe, National Research Council Canada (Canada)
Martin Vachon, National Research Council Canada (Canada)
Pavel Cheben, National Research Council Canada (Canada)
Siegfried Janz, National Research Council Canada (Canada)

Published in SPIE Proceedings Vol. 8266:
Silicon Photonics VII
Joel Kubby; Graham Trevor Reed, Editor(s)

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