
Proceedings Paper
VCSEL beam control with collective and self-aligned polymer technologiesFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
We present recent results on the integration of polymer microlenses on single mode Vertical-Cavity
Surface-Emitting Lasers (VCSELs) to achieve output beam control. We describe in particular low
cost and collective fabrication methods developed to allow for a self-alignment of the lens with the
laser source. These approaches are based either on surface tension effects or on a self-writing
process using novel Near Infra-Red (NIR) photopolymers. Results on beam collimation at 850nm are
presented and compared to a fully vectorial and three-dimensional optical model that takes into
account the complete geometry of laser resonator is used. Results on short distance focusing using
self-aligned microtips are presented. Considerations to achieve an active beam control by means of
polymer-based MEMS (Micro-electro-mechanical System) are also discussed. Potential applications
may concern the improvement of VCSEL insertion in optical interconnects or sensing systems, as
well as the fabrication of optical micro-probes for near-field microscopy.
Paper Details
Date Published: 7 February 2012
PDF: 9 pages
Proc. SPIE 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760U (7 February 2012); doi: 10.1117/12.910719
Published in SPIE Proceedings Vol. 8276:
Vertical-Cavity Surface-Emitting Lasers XVI
Chun Lei; Kent D. Choquette, Editor(s)
PDF: 9 pages
Proc. SPIE 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760U (7 February 2012); doi: 10.1117/12.910719
Show Author Affiliations
Véronique Bardinal, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Thierry Camps, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Benjamin Reig, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Pierluigi Debernardi, Istituto di Elettronica e di Ingegneria dell'Informazione e delle Telecomunicazioni, CNR (Italy)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Thierry Camps, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Benjamin Reig, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Pierluigi Debernardi, Istituto di Elettronica e di Ingegneria dell'Informazione e delle Telecomunicazioni, CNR (Italy)
Olivier Soppera, CNRS, IS2M, Institut de Science des Matériaux de Mulhouse, Univ. de Haute Alsace (France)
David Barat, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Jean-Baptiste Doucet, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Emmanuelle Daran, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
David Barat, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Jean-Baptiste Doucet, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Emmanuelle Daran, CNRS, LAAS (France)
LAAS, UPS, INSA, INP, ISAE, Univ. de Toulouse (France)
Published in SPIE Proceedings Vol. 8276:
Vertical-Cavity Surface-Emitting Lasers XVI
Chun Lei; Kent D. Choquette, Editor(s)
© SPIE. Terms of Use
