Share Email Print

Proceedings Paper

Advanced millimeter-wave security portal imaging techniques
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Millimeter-wave (mm-wave) imaging is rapidly gaining acceptance as a security tool to augment conventional metal detectors and baggage x-ray systems for passenger screening at airports and other secured facilities. This acceptance indicates that the technology has matured; however, many potential improvements can yet be realized. The authors have developed a number of techniques over the last several years including novel image reconstruction and display techniques, polarimetric imaging techniques, array switching schemes, and high-frequency high-bandwidth techniques. All of these may improve the performance of new systems; however, some of these techniques will increase the cost and complexity of the mm-wave security portal imaging systems. Reducing this cost may require the development of novel array designs. In particular, RF photonic methods may provide new solutions to the design and development of the sequentially switched linear mm-wave arrays that are the key element in the mm-wave portal imaging systems. Highfrequency, high-bandwidth designs are difficult to achieve with conventional mm-wave electronic devices, and RF photonic devices may be a practical alternative. In this paper, the mm-wave imaging techniques developed at PNNL are reviewed and the potential for implementing RF photonic mm-wave array designs is explored.

Paper Details

Date Published: 28 February 2012
PDF: 12 pages
Proc. SPIE 8259, RF and Millimeter-Wave Photonics II, 82590G (28 February 2012); doi: 10.1117/12.910515
Show Author Affiliations
David M. Sheen, Pacific Northwest National Lab. (United States)
Bruce E. Bernacki, Pacific Northwest National Lab. (United States)
Douglas L. McMakin, Pacific Northwest National Lab. (United States)

Published in SPIE Proceedings Vol. 8259:
RF and Millimeter-Wave Photonics II
Robert L. Nelson; Dennis W. Prather; Chris Schuetz; Garrett J. Schneider, Editor(s)

© SPIE. Terms of Use
Back to Top