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Proceedings Paper

Performance evaluation of point-spread function engineering to reduce the impact of depth-induced aberrations on extended depth-of-field microscopy
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Paper Abstract

In this study, we evaluated a point-spread function (PSF) engineered using wave front encoding (WFE) and a generalized cubic phase mask (GCPM) design selected to reduce the impact of depth-induced spherical aberration (SA) on extended depth-of-field (EDOF) microscopy with high NA lenses. Mean-square-error based metrics computed from three-dimensional (3D) depth-variant WFE-PSFs with increasing amounts of SA were used to quantify the engineered PSF's sensitivity to SA and to compare it to the sensitivity of the cubic-phase mask (CPM) PSF traditionally used for EDOF microscopy. The potential performance of the engineered PSF with resilience to SA was further evaluated with simulations in which EDOF images of a 3D object were obtained by processing WFE images with and without SA. A qualitative and quantitative comparison of the EDOF images with the true object show that the WFE-PSF engineering with the selected GCPM design provides better performance in reducing the impact of SA. In addition, the GCPM-based EDOF images do not suffer from the known lateral shift of object features located away from the plane of focus encountered in traditional CPM-based EDOF images.

Paper Details

Date Published: 2 February 2012
PDF: 8 pages
Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 822703 (2 February 2012); doi: 10.1117/12.908908
Show Author Affiliations
Shuai Yuan, The Univ. of Memphis (United States)
Chrysanthe Preza, The Univ. of Memphis (United States)

Published in SPIE Proceedings Vol. 8227:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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