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Proceedings Paper

Identification of phase transformation using optical emission spectroscopy for direct metal deposition process
Author(s): Lijun Song; Cunshan Wang; Jyoti Mazumder
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Paper Abstract

Service performance of all materials is determined by the structure-property relationship of the materials. However, the analysis of microstructure of an alloy has, to date, been limited to time- and labor-intensiveanalysis such as optical or scanning electron microscopes after material is synthesized. Presently there is no known method determining the microstructure during the material synthesis process. Here we report that the phase transformation can affect the characteristics of laser induced plasma during a direct laser material synthesis process. The plasma spectral line intensity ratio from different elements is only proportional to the elemental concentration within the same phase. The linear relationship is broken when there is a phase change and a new linear relationship is formed within the range of the new phase. This phase related plasma change indicates the initial nucleation of the crystallography of the alloy in early stage. This phase determined plasma characteristics will be applicable for in-situ phase transformation identification in real time during material synthesis process where plasma is generated. For synthesis where plasma is not generated, pulsed laser induced plasma can be used to sample the synthesized material for phase identification.

Paper Details

Date Published: 6 February 2012
PDF: 9 pages
Proc. SPIE 8239, High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications, 82390G (6 February 2012); doi: 10.1117/12.908264
Show Author Affiliations
Lijun Song, Univ. of Michigan (United States)
Cunshan Wang, Univ. of Michigan (United States)
Dalian Univ. of Technology (China)
Jyoti Mazumder, Univ. of Michigan (United States)

Published in SPIE Proceedings Vol. 8239:
High Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications
Eckhard Beyer; Timothy Morris, Editor(s)

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