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Proceedings Paper

Computational imaging of defects in commercial substrates for electronic and photonic devices
Author(s): Masayuki Fukuzawa; Ryo Kashiwagi; Masayoshi Yamada
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Paper Abstract

Computational defect imaging has been performed in commercial substrates for electronic and photonic devices by combining the transmission profile acquired with an imaging type of linear polariscope and the computational algorithm to extract a small amount of birefringence. The computational images of phase retardation δ exhibited spatial inhomogeneity of defect-induced birefringence in GaP, LiNbO3, and SiC substrates, which were not detected by conventional 'visual inspection' based on simple optical refraction or transmission because of poor sensitivity. The typical imaging time was less than 30 seconds for 3-inch diameter substrate with the spatial resolution of 200 μm, while that by scanning polariscope was 2 hours to get the same spatial resolution. Since our proposed technique have been achieved high sensitivity, short imaging time, and wide coverage of substrate materials, which are practical advantages over the laboratory-scale apparatus such as X-ray topography and electron microscope, it is useful for nondestructive inspection of various commercial substrates in production of electronic and photonic devices.

Paper Details

Date Published: 10 February 2012
PDF: 7 pages
Proc. SPIE 8296, Computational Imaging X, 829616 (10 February 2012); doi: 10.1117/12.908056
Show Author Affiliations
Masayuki Fukuzawa, Kyoto Institute of Technology (Japan)
Ryo Kashiwagi, Kyoto Institute of Technology (Japan)
Masayoshi Yamada, Kyoto Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 8296:
Computational Imaging X
Charles A. Bouman; Ilya Pollak; Patrick J. Wolfe, Editor(s)

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