
Proceedings Paper
GPGPU-based surface inspection from structured white lightFormat | Member Price | Non-Member Price |
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Paper Abstract
Automatic surface inspection has been used in the industry to reliably detect all kinds of surface defects and
to measure the overall quality of a produced piece. Structured light systems (SLS) are based on the reconstruction
of the 3D information of a selected area by projecting several phase-shifted sinusoidal patterns onto
a surface. Due to the high speed of production lines, surface inspection systems require extremely fast imaging
methods and lots of computational power. The cost of such systems can easily become considerable. The use
of standard PCs and Graphics Processing Units (GPUs) for data processing tasks facilitates the construction
of cost-effective systems. We present a parallel implementation of the required algorithms written in C with
CUDA extensions. In our contribution, we describe the challenges of the design on a GPU, compared with a
traditional CPU implementation. We provide a qualitative evaluation of the results and a comparison of the
algorithm speed performance on several platforms. The system is able to compute two megapixels height maps
with 100 micrometers spatial resolution in less than 200ms on a mid-budget laptop. Our GPU implementation
runs about ten times faster than our previous C code implementation.
Paper Details
Date Published: 2 February 2012
PDF: 11 pages
Proc. SPIE 8295, Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 829510 (2 February 2012); doi: 10.1117/12.907349
Published in SPIE Proceedings Vol. 8295:
Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II
Karen O. Egiazarian; John Recker; Guijin Wang; Sos S. Agaian; Atanas P. Gotchev, Editor(s)
PDF: 11 pages
Proc. SPIE 8295, Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 829510 (2 February 2012); doi: 10.1117/12.907349
Show Author Affiliations
Miguel Bordallo López, Univ. of Oulu (Finland)
Karri Niemelä, VTT Technical Research Ctr. of Finland (Finland)
Karri Niemelä, VTT Technical Research Ctr. of Finland (Finland)
Olli Silvén, Univ. of Oulu (Finland)
Published in SPIE Proceedings Vol. 8295:
Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II
Karen O. Egiazarian; John Recker; Guijin Wang; Sos S. Agaian; Atanas P. Gotchev, Editor(s)
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