
Proceedings Paper
The design of analysis system of refractive index profile of optical fiberFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper developed an intelligent optical fiber refractive index profile measurement system. This system is based on
the principle of the refracted near-field measurement. The whole system is the use of a unique high-resolution
non-contact capacitive displacement sensor to monitor the scanning position of the fiber measured. At the same time we
used a shading screen which was embedded into the sample pool. Using this method, we can totally save space. Finally,
we used a high curvature condenser to collection of reflected light which we used a photo detector to collect. The
collected signal was brought into the computer to calculate the optical fiber refractive index. The whole system is totally
enclosed operating instrument with an easy-to-use software interface for performing measurements of both multi mode
and single mode optical fiber, which can easy pick up the signal automatically and processing in computer. Measurement
accuracy can reach 10-4. It is fit for measuring the refractive index of single-mode fibers and multi-mode fibers.
Paper Details
Date Published: 5 December 2011
PDF: 7 pages
Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 819719 (5 December 2011); doi: 10.1117/12.906571
Published in SPIE Proceedings Vol. 8197:
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Han-Ping Shieh; Kimio Tatsuno, Editor(s)
PDF: 7 pages
Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 819719 (5 December 2011); doi: 10.1117/12.906571
Show Author Affiliations
Gao He, Harbin Engineering Univ. (China)
Zhihai Liu, Harbin Engineering Univ. (China)
Published in SPIE Proceedings Vol. 8197:
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Han-Ping Shieh; Kimio Tatsuno, Editor(s)
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