
Proceedings Paper
Photoconductivity and photocatalytic activity of ZnO thin films grown via thermal oxidationFormat | Member Price | Non-Member Price |
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Paper Abstract
We have investigated the photoconductivity and photocatalytic properties of polycrystalline zinc oxide (ZnO) films
grown on c-plane sapphire substrates. Zinc-metal films where grown on sapphire substrates via dc-sputter deposition at
room temperature with subsequent thermal annealing in air at 300°C, 600°C, 900°C, and 1200°C. Photoluminescence
spectra indicate four emission bands: excitonic ultraviolet, blue, and deep-level green and yellow emission. The ratio of
deep-level green emission to UV excitonic emission was observed to decrease with decreasing annealing temperature
from 1200°C to 300°C. Metal-semiconductor-metal (MSM) Al:ZnO:Al planar UV photodetectors where fabricated via
sputter deposition of aluminum ohmic contacts on the resulting ZnO films. Decreasing photocurrent is seen for
increasing annealing temperature, which is consistent with PL studies. A responsivity of ~0.1 A/W was observed.
Photocatalytic activity follows half-order reaction kinetics as determined by photodegradation of Rhodamine B.
Paper Details
Date Published: 29 February 2012
PDF: 8 pages
Proc. SPIE 8263, Oxide-based Materials and Devices III, 82631M (29 February 2012); doi: 10.1117/12.906227
Published in SPIE Proceedings Vol. 8263:
Oxide-based Materials and Devices III
Ferechteh H. Teherani; David C. Look; David J. Rogers, Editor(s)
PDF: 8 pages
Proc. SPIE 8263, Oxide-based Materials and Devices III, 82631M (29 February 2012); doi: 10.1117/12.906227
Show Author Affiliations
J. C. Moore, Coastal Carolina Univ. (United States)
R. Louder, Coastal Carolina Univ. (United States)
R. Louder, Coastal Carolina Univ. (United States)
L. R. Covington, Coastal Carolina Univ. (United States)
R. Stansell, Coastal Carolina Univ. (United States)
R. Stansell, Coastal Carolina Univ. (United States)
Published in SPIE Proceedings Vol. 8263:
Oxide-based Materials and Devices III
Ferechteh H. Teherani; David C. Look; David J. Rogers, Editor(s)
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