
Proceedings Paper
Analysis of 3D scene using structured light techniqueFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The algorithms presented in this paper are focused on the analysis of 3D scene using structured light technique.
The light pattern which was projected on the scene consisted of horizontal stripes of different colors. These colors
corresponded to the symbols creating the de Bruijn sequence. The first plane objects of analysed 3D scene were human
hands. In this paper the discussion concerning important features of the structured light pattern is made. The focus is
made on the analysis of the pattern corresponding to the de Bruijn sequence. The algorithm for computing the depth map
of 3D scene using triangulation method is proposed. The most important part of the algorithm for the depth map
evaluation is related with the extraction of colors from the stripes of the projected light pattern. The discussion
concerning proposed algorithms for color detection is made and the results of the tests on HD images are described. The
implementation of proposed methods using parallel programming with openCL architecture enabled crating real-time
application.
Paper Details
Date Published: 7 October 2011
PDF: 7 pages
Proc. SPIE 8008, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2011, 80081B (7 October 2011); doi: 10.1117/12.905701
Published in SPIE Proceedings Vol. 8008:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2011
Ryszard S. Romaniuk, Editor(s)
PDF: 7 pages
Proc. SPIE 8008, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2011, 80081B (7 October 2011); doi: 10.1117/12.905701
Show Author Affiliations
Marcin Jędryka, Warsaw Univ. of Technology (Poland)
Published in SPIE Proceedings Vol. 8008:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2011
Ryszard S. Romaniuk, Editor(s)
© SPIE. Terms of Use
