
Proceedings Paper
CAIP system for vision-based on-machine measurementFormat | Member Price | Non-Member Price |
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Paper Abstract
Computer-Aided Inspection Planning (CAIP) is an important module of modern dimensional measuring instruments,
utilizing the CAIP for machined parts inspection is an important indication of the level of automation and intelligence.
Aiming at the characteristic of visual inspection, it develops a CAIP system for vision-based On-Machine Measurement
(OMM) based on a CAD development platform whose kernel is Open CASCADE. The working principle of
vision-based OMM system is introduced, and the key technologies of CAIP include inspection information extraction,
sampling strategy, inspection path planning, inspection codes generation, inspection procedure verification, data
post-processor, comparison, and so on. The entire system was verified on a CNC milling machine, and relevant examples
show that the system can accomplish automatic inspection planning task for common parts efficiently.
Paper Details
Date Published: 15 November 2011
PDF: 7 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213V (15 November 2011); doi: 10.1117/12.905508
Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)
PDF: 7 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213V (15 November 2011); doi: 10.1117/12.905508
Show Author Affiliations
Rui-xue Xia, Hefei Univ. of Technology (China)
Rong-sheng Lu, Hefei Univ. of Technology (China)
Yan-qiong Shi, Hefei Univ. of Technology (China)
Rong-sheng Lu, Hefei Univ. of Technology (China)
Yan-qiong Shi, Hefei Univ. of Technology (China)
Qi Li, Hefei Univ. of Technology (China)
Jing-tao Dong, Hefei Univ. of Technology (China)
Ning Liu, Hefei Univ. of Technology (China)
Jing-tao Dong, Hefei Univ. of Technology (China)
Ning Liu, Hefei Univ. of Technology (China)
Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)
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