
Proceedings Paper
Nonlinear analysis and dynamic compensation of stylus scanning measurement with wide rangeFormat | Member Price | Non-Member Price |
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Paper Abstract
Surface topography is an important geometrical feature of a workpiece that influences its quality and functions such as
friction, wearing, lubrication and sealing. Precision measurement of surface topography is fundamental for product
quality characterizing and assurance.
Stylus scanning technique is a widely used method for surface topography measurement, and it is also regarded as the
international standard method for 2-D surface characterizing. Usually surface topography, including primary profile,
waviness and roughness, can be measured precisely and efficiently by this method. However, by stylus scanning method
to measure curved surface topography, the nonlinear error is unavoidable because of the difference of horizontal position
of the actual measured point from given sampling point and the nonlinear transformation process from vertical
displacement of the stylus tip to angle displacement of the stylus arm, and the error increases with the increasing of
measuring range.
In this paper, a wide range stylus scanning measurement system based on cylindrical grating interference principle is
constructed, the originations of the nonlinear error are analyzed, the error model is established and a solution to decrease
the nonlinear error is proposed, through which the error of the collected data is dynamically compensated.
Paper Details
Date Published: 15 November 2011
PDF: 6 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213U (15 November 2011); doi: 10.1117/12.905506
Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)
PDF: 6 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213U (15 November 2011); doi: 10.1117/12.905506
Show Author Affiliations
Heiyang Hui, Huazhong Univ. of Science and Technology (China)
Xiaojun Liu, Huazhong Univ. of Science and Technology (China)
Xiaojun Liu, Huazhong Univ. of Science and Technology (China)
Wenlong Lu, Huazhong Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)
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