
Proceedings Paper
Evaluation method for one-dimensional assembly yield based on Taguchi orthogonal experimentFormat | Member Price | Non-Member Price |
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Paper Abstract
Evaluation method for one-dimensional assembly yield is presented based on Taguchi orthogonal experiment. Firstly,
according to Taguchi parameter design criteria, component loop sizes are taken for factors of Taguchi orthogonal
experiment, each factor is divided into three levels. After approriate orthogonal experiment table is selected, orthogonal
experiment is operated. Then the mean and standard deviation of close loop size are solved, which are used to obtain
assembly yield. The influence on assembly yield of each factor is analyzed by using extreme value method and the
results are validated by using Monte Carlo simulation. Finally, a gear components assembly is provided to illustrate the
effectiveness of the presented method .It has a guiding significance for machanical assembly design.
Paper Details
Date Published: 15 November 2011
PDF: 6 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832136 (15 November 2011); doi: 10.1117/12.905244
Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)
PDF: 6 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832136 (15 November 2011); doi: 10.1117/12.905244
Show Author Affiliations
Zejun Wen, Hunan Univ. of Science and Technology (China)
Zhengqiang Zhu, Hunan Univ. of Science and Technology (China)
Zhengqiang Zhu, Hunan Univ. of Science and Technology (China)
Zhijin Zhou, Hunan Univ. of Science and Technology (China)
Shuyi Yang, Hunan Univ. of Science and Technology (China)
Shuyi Yang, Hunan Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)
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