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Proceedings Paper

Imaging spectrograph for fast LED optical properties measurement
Author(s): Kai-Ping Chuang; Fu-Cheng Yang; Yu-Shan Chang; Mao-Sheng Huang
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Paper Abstract

Due to the booming in LED applications, fast and accurate inspection tools to monitor LED quality is necessary. In this paper, we propose two new methods to measure LED optical properties by using imaging spectrograph. Imaging-type spectrograph with high spatial and spectral resolutions is designed for LED wafer measurement. Fiber-type spectrograph with multi-head structure is designed for LED backlight and LED light-bar measurement. Optical properties of LED include chromaticity and luminous intensity, which are measured by following CIE recommendations. The performance of imaging spectrograph is evaluated to meet industrial requirements for LED measurement.

Paper Details

Date Published: 15 November 2011
PDF: 7 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832126 (15 November 2011); doi: 10.1117/12.904937
Show Author Affiliations
Kai-Ping Chuang, Industrial Technology Research Institute (Taiwan)
Fu-Cheng Yang, Industrial Technology Research Institute (Taiwan)
Yu-Shan Chang, Industrial Technology Research Institute (Taiwan)
Mao-Sheng Huang, Industrial Technology Research Institute (Taiwan)

Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)

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