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Proceedings Paper

Morphology and optical study of dye-doped TiO2-SiO2 thin films
Author(s): Arvind K. Gathania; Naresh Dhiman; Ankita Sharma; B. P. Singh
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Paper Abstract

In the present work, we have prepared functional dye doped TiO2-SiO2 thin films by vertical sedimentation technique. Thin film samples are annealed at different temperature from 50oC to 850oC. Morphology and chemical bonding information is analysed using atomic force microscopy (AFM), and Fourier transform infrared spectroscopy (FTIR) respectively. Optical properties are characterized by using UV-visible spectroscopy. Effect of annealing temperature on the photonic forbidden band gap is also presented. The experimental measured values are compared with theoretical estimated results.

Paper Details

Date Published: 23 December 2011
PDF: 7 pages
Proc. SPIE 8204, Smart Nano-Micro Materials and Devices, 82043N (23 December 2011);
Show Author Affiliations
Arvind K. Gathania, National Institute of Technology, Hamirpur (India)
Naresh Dhiman, National Institute of Technology, Hamirpur (India)
Ankita Sharma, National Institute of Technology, Hamirpur (India)
B. P. Singh, Indian Institute of Technology Bombay (India)

Published in SPIE Proceedings Vol. 8204:
Smart Nano-Micro Materials and Devices
Saulius Juodkazis; Min Gu, Editor(s)

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