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Proceedings Paper

Fluctuation elimination of fringe pattern to improve the accuracy of phase calculation
Author(s): Shujun Huang; Zonghua Zhang; Tong Guo; Sixiang Zhang; Xiaotang Hu
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Paper Abstract

3D fringe projection measurement techniques are increasingly important in production for automation, quality control, reversal engineering, and biomedical engineering because of the advantages of non-contact operation, full-field acquisition and automatic data processing. With the advent of DLP (Digital Light Processing) projectors, digital fringe pattern projection techniques have been widely studied in academia and applied to industries. The experimental data from living profile of fringe patterns show that the obtained intensity has some fluctuation, which cause the calculated phase data inaccuracy. This paper presents one software method to eliminate the fluctuation between fringe patterns. Four-step phase-shifting algorithm is used to calculate the wrapped phase data, so four fringe pattern images having pi/2 shift in between need to be captured. Because of the fluctuation of intensity, the captured fringe patterns have an up or down shift among the four images. By considering the histogram of each fringe pattern, we present one compensation method to eliminate the fluctuation between fringe patterns. Simulated data are first tested by generating fringe patterns with fluctuation. Then experimental data from a 3D imaging system demonstrate the validity for calculating the phase and shape information with high accuracy. The results show that the proposed method eliminates the fluctuation between fringe pattern images to give accurate shape data information.

Paper Details

Date Published: 28 November 2011
PDF: 7 pages
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000I (28 November 2011); doi: 10.1117/12.904846
Show Author Affiliations
Shujun Huang, Hebei Univ. of Technology (China)
Zonghua Zhang, Hebei Univ. of Technology (China)
Tong Guo, Tianjin Univ. (China)
Sixiang Zhang, Hebei Univ. of Technology (China)
Xiaotang Hu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 8200:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

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