Proceedings Paper
Patterning effect mitigation using complementary data for NRZ wavelength conversion with a SOA-MZI| Format | Member Price | Non-Member Price |
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Paper Abstract
A novel scheme of Non-Return-to-Zero (NRZ) all-optical wavelength conversion is proposed using a semiconductor
optical amplifier based Mach-Zehnder interferometer (SOA-MZI), where the complementary NRZ data is used to
mitigate SOA patterning effect. The performances of the wavelength converters are numerically evaluated in terms of the
waveform, eye-diagram and Q factor of the output signals at 40 Gb/s, using a time-domain SOA model. It is shown that
the new complementary scheme significantly improves the Q factor of the converted signal from 3.8 to 8.1, compared
with the traditional scheme.
Paper Details
Date Published: 28 November 2011
PDF: 6 pages
Proc. SPIE 8308, Optoelectronic Materials and Devices VI, 83080F (28 November 2011); doi: 10.1117/12.904084
Published in SPIE Proceedings Vol. 8308:
Optoelectronic Materials and Devices VI
Guang-Hua Duan, Editor(s)
PDF: 6 pages
Proc. SPIE 8308, Optoelectronic Materials and Devices VI, 83080F (28 November 2011); doi: 10.1117/12.904084
Show Author Affiliations
Gang Wang, Shanghai Jiao Tong Univ. (China)
Xuelin Yang, Shanghai Jiao Tong Univ. (China)
Xuelin Yang, Shanghai Jiao Tong Univ. (China)
Published in SPIE Proceedings Vol. 8308:
Optoelectronic Materials and Devices VI
Guang-Hua Duan, Editor(s)
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