
Proceedings Paper
Linewidth narrowing and wavelength stabilization of high-power laser diode array by use of volume Bragg gratingFormat | Member Price | Non-Member Price |
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Paper Abstract
The characteristics of the LDA operating in the steady state are analyzed. The carrier density, oscillating frequency,
photon density compared to those in free-running state operating in the in-phase mode are analyzed. In this paper,
linewidth narrowing and wavelength stabilization of a high-power laser diode array are obtained by using an external
cavity consisting of Volume Bragg Grating (VBG) with the reflectivity of 15 %. At the driven current up to 40 A, an
output power of 28 W is obtained with the linewidth down to 0.3 nm, which corresponds to the efficiency of 93.3%
compared to the output power in free-running LDA. The intensity of the external-cavity LDA is improved by a factor of
approximately 3.3, and the wavelength is stabilized at 808nm determined by the VBG. This kind of laser diode array has
potential applications in pumping solid-state lasers, medical treatment and gas sensing.
Paper Details
Date Published: 5 December 2011
PDF: 9 pages
Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 81970R (5 December 2011); doi: 10.1117/12.904018
Published in SPIE Proceedings Vol. 8197:
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Han-Ping Shieh; Kimio Tatsuno, Editor(s)
PDF: 9 pages
Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 81970R (5 December 2011); doi: 10.1117/12.904018
Show Author Affiliations
Hao Wang, Soochow Univ. (China)
Xiao Yuan, Soochow Univ. (China)
Published in SPIE Proceedings Vol. 8197:
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Han-Ping Shieh; Kimio Tatsuno, Editor(s)
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