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Proceedings Paper

Analysis of near field microwave and conventional optical images
Author(s): Guillermo López-Maldonado; Naser Qureshi; Hesiquio Vargas-Hernández; César L. Ordóñez-Romero; M. Avendaño-Alejo; Oleg V. Kolokoltsev
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Paper Abstract

In this work we present near field microwave images of microelectronic circuits and their interpretation to complement the conventional optical analysis. We show a highly simplified design of a resonant probe with dynamically tunable capacitive coupling and with high sensitivity. Images were obtained by measuring the microwave reflection coefficient operating a 7 GHz. This design represents a simplified and highly effective approach to implementing near field microwave microscopy.

Paper Details

Date Published: 2 November 2011
PDF: 9 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 801187 (2 November 2011); doi: 10.1117/12.903423
Show Author Affiliations
Guillermo López-Maldonado, Univ. Nacional Autónoma de México (Mexico)
Naser Qureshi, Univ. Nacional Autónoma de México (Mexico)
Hesiquio Vargas-Hernández, Univ. Nacional Autónoma de México (Mexico)
César L. Ordóñez-Romero, Univ. Nacional Autónoma de México (Mexico)
M. Avendaño-Alejo, Univ. Nacional Autónoma de México (Mexico)
Oleg V. Kolokoltsev, Univ. Nacional Autónoma de México (Mexico)


Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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