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Proceedings Paper

Numerical study of the medium thickness in the Z-scan technique
Author(s): I. Severiano Carrillo; M. M. Méndez Otero; M. L. Arroyo Carrasco; M. D. Iturbe Castillo
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Paper Abstract

The optical characterization of nonlinear media through the Z-scan technique considers initially a thin medium (with a thickness much less than the beam depth of focus). It has been observed that increasing the thickness of the medium the transmittance increases, this means that n2 increases, for this reason we will present a numerical model to determinate the minimum thin and the maximum thick medium limit. A thin medium is considered as a thin lens with focal length F1 and a thick medium can be regarded as a set of such thin lenses set with focal lengths F2, these lenses are contained in a medium whit a refraction index different than air. This analysis is made through Matlab using the theory of Gaussian beams, ABCD matrices and the q parameter, elementary theory in the development of this work, where the main feature of this model is that the nonlinearity type of the medium is considered as an integer constant in its focal length3. We present the graphs obtained from Z-scan for thick medium with both thermal and Kerr nonlinearities.

Paper Details

Date Published: 25 October 2011
PDF: 5 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80113L (25 October 2011); doi: 10.1117/12.902201
Show Author Affiliations
I. Severiano Carrillo, Benemérita Univ. Autónoma de Puebla (Mexico)
M. M. Méndez Otero, Benemérita Univ. Autónoma de Puebla (Mexico)
M. L. Arroyo Carrasco, Benemérita Univ. Autónoma de Puebla (Mexico)
M. D. Iturbe Castillo, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)

Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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