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Proceedings Paper

Polarimetry-based far-field method for high-resolution optical microscopy
Author(s): Oscar G. Rodríguez-Herrera; David Lara; Chris Dainty
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Paper Abstract

We present a polarimetry-based far-field method for high-resolution optical microscopy. The method is based on the measurement of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture objective lens and allows us to distinguish between different sub-resolution objects with no need for an active scanning. Our numerical and experimental results show that the scattering-angle-resolved polarization state distributions can be used in the characterization of particles and structures with features below or at the edge of the Rayleigh resolution limit.

Paper Details

Date Published: 21 October 2011
PDF: 9 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80110V (21 October 2011); doi: 10.1117/12.902119
Show Author Affiliations
Oscar G. Rodríguez-Herrera, National Univ. of Ireland, Galway (Ireland)
David Lara, Imperial College London (United Kingdom)
Chris Dainty, National Univ. of Ireland, Galway (Ireland)


Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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