
Proceedings Paper
Terahertz wave polarization extract with quartz crystalFormat | Member Price | Non-Member Price |
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Paper Abstract
We present a method to extract the polarization of terahertz wave by placing a 4-mm-thick quartz
crystal on the terahertz beam. The polarization and electric field amplitude are varied by a terahertz
polarizer. The quartz crystal is fixed at 45 degree with respect to the horizontal direction and the
terahertz polarization angle can be extracted by the ratio of the two electric field amplitude
corresponding to the ordinary and extraordinary waves that transmitted through the quartz crystal. The
result shows this method is valid to measure polarization of terahertz wave, and it is more convenient
and saving time for only once measure.A
Paper Details
Date Published: 11 August 2011
PDF: 9 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 81951A (11 August 2011); doi: 10.1117/12.900796
Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)
PDF: 9 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 81951A (11 August 2011); doi: 10.1117/12.900796
Show Author Affiliations
Chao Deng, Capital Normal Univ. (China)
Beijing Institute of Technology (China)
Liangliang Zhang, Capital Normal Univ. (China)
Hua Zhong, Beijing Institute of Technology. (China)
Beijing Institute of Technology (China)
Liangliang Zhang, Capital Normal Univ. (China)
Hua Zhong, Beijing Institute of Technology. (China)
Fei Yu, Capital Normal Univ. (China)
Cunlin Zhang, Capital Normal Univ. (China)
Cunlin Zhang, Capital Normal Univ. (China)
Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)
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