
Proceedings Paper
Terahertz and mid-infrared tunable source based on difference frequency generation in GaSe crystalFormat | Member Price | Non-Member Price |
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Paper Abstract
We developed a narrow line width terahertz and mid-infrared source based on difference frequency generation(DFG) in
GaSe crystal. The source could be easily continuous-tuned in a terahertz region of 68.1-1386 μm (0.22-4.4 THz) and a
mid-infrared region of 16.1-26.5 m without altering any component. The maximal peak power of terahertz waves is 9.1
W at 143 μm (2.1 THz), which corresponds to a power conversion efficiency of 2.8~10-5. Using a FTIR spectrometer, we
verified the wavelength and the line width of the source.
Paper Details
Date Published: 11 August 2011
PDF: 7 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 819513 (11 August 2011); doi: 10.1117/12.900744
Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)
PDF: 7 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 819513 (11 August 2011); doi: 10.1117/12.900744
Show Author Affiliations
Jin-xing Lu, Shanghai Institute of Technical Physics (China)
Bing-bing Wang, Shanghai Institute of Technical Physics (China)
Jing-guo Huang, Shanghai Institute of Technical Physics (China)
Bing-bing Wang, Shanghai Institute of Technical Physics (China)
Jing-guo Huang, Shanghai Institute of Technical Physics (China)
Zhi-ming Huang, Shanghai Institute of Technical Physics (China)
Xue-ming Shen, Shanghai Institute of Technical Physics (China)
Xue-ming Shen, Shanghai Institute of Technical Physics (China)
Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)
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