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Proceedings Paper

A new FOD recognition algorithm based on multi-source information fusion and experiment analysis
Author(s): Yu Li; Gang Xiao
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Paper Abstract

Foreign Object Debris (FOD) is a kind of substance, debris or article alien to an aircraft or system, which would potentially cause huge damage when it appears on the airport runway. Due to the airport's complex circumstance, quick and precise detection of FOD target on the runway is one of the important protections for airplane's safety. A multi-sensor system including millimeter-wave radar and Infrared image sensors is introduced and a developed new FOD detection and recognition algorithm based on inherent feature of FOD is proposed in this paper. Firstly, the FOD's location and coordinate can be accurately obtained by millimeter-wave radar, and then according to the coordinate IR camera will take target images and background images. Secondly, in IR image the runway's edges which are straight lines can be extracted by using Hough transformation method. The potential target region, that is, runway region, can be segmented from the whole image. Thirdly, background subtraction is utilized to localize the FOD target in runway region. Finally, in the detailed small images of FOD target, a new characteristic is discussed and used in target classification. The experiment results show that this algorithm can effectively reduce the computational complexity, satisfy the real-time requirement and possess of high detection and recognition probability.

Paper Details

Date Published: 8 September 2011
PDF: 10 pages
Proc. SPIE 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, 81932V (8 September 2011);
Show Author Affiliations
Yu Li, Shanghai Jiaotong Univ. (China)
Gang Xiao, Shanghai Jiaotong Univ. (China)

Published in SPIE Proceedings Vol. 8193:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications
Jeffery J. Puschell; Junhao Chu; Haimei Gong; Jin Lu, Editor(s)

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