
Proceedings Paper
The low light level image intensifier's application in x-ray imagingFormat | Member Price | Non-Member Price |
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Paper Abstract
The low light level image intensifier was usually applied in the night observation, and it has been developed and
improved for a long history. While it can also be used in the x ray imaging system for its specialty in photos multiplying
and conversion, so in this paper, the technology development of the low light level image intensifier was described at
first and then a novel x ray image intensifier designed by our research group is introduced. The x ray intensifying screen
was the x ray sensor converting the x ray into the visible light. For the visible light from the x ray image intensifier was
too weak to see the image, the low light level image intensifier was used to intensify the light further. When the low light level image intensifier was selected, the novel x ray image intensifier's performance was modeled, which can given the comparison in resolution and brightness between with and without the low light level image intensifier. In conclusion, the novel x ray imaging system's performance is good enough to be applied to security checking, non-destructive testing, and industry detection.
Paper Details
Date Published: 18 August 2011
PDF: 5 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81941M (18 August 2011); doi: 10.1117/12.900232
Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)
PDF: 5 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81941M (18 August 2011); doi: 10.1117/12.900232
Show Author Affiliations
Chunyu Yu, Peking Univ. Shenzhen Graduate School (China)
Nanjing Univ. of Posts and Telecommunication (China)
Lingli Kong, Shenzhen Invengo Information Technology Co., Ltd. (China)
Nanjing Univ. of Posts and Telecommunication (China)
Lingli Kong, Shenzhen Invengo Information Technology Co., Ltd. (China)
Junju Zhang, Nanjing Univ. of Science and Technology (China)
Shengdong Zhang, Peking Univ. Shenzhen Graduate School (China)
Shengdong Zhang, Peking Univ. Shenzhen Graduate School (China)
Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)
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