Share Email Print

Proceedings Paper

A thiol-ene/methacrylate-based polymer for creating integrated optofluidic devices
Author(s): Martha-Elizabeth Baylor; Robert W. Boyne; Neil B. Cramer; Christopher N. Bowman; Robert R. McLeod
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We present a thiol-ene/methacrylate-based polymer capable of creating both physical fluidic features and optical index features via a series of three UV mask-lithography steps. The process of creating the two types of features are addressed independently by control of the polymerization and diffusion rates within the polymer system. The rapidly curing methacrylate creates a gelled, rubbery scaffold structure that allows for the creation of physical features and also monomer diffusion within the structure. The thiol-ene is a high-index polymer that cures more slowly in the presence of the methacrylate and is used to create the index structures via diffusion of replacement monomer into exposed regions. We demonstrate low-loss, multi-mode optical waveguides coupled to a fluidic channel to implement a refractometer. Waveguide loss at 635 nm for a 12.5 mm x 63.5 micron x 63.5 micron waveguide-only sample is 0.57 dB. A waveguide plus fluidic-channel device acts as a refractometer whose optical throughput is dependent on the index of refraction of the fluid in the channel.

Paper Details

Date Published: 9 September 2011
PDF: 8 pages
Proc. SPIE 8097, Optical Trapping and Optical Micromanipulation VIII, 80970P (9 September 2011); doi: 10.1117/12.899719
Show Author Affiliations
Martha-Elizabeth Baylor, Carleton College (United States)
Robert W. Boyne, Univ. of Colorado at Boulder (United States)
Neil B. Cramer, Univ. of Colorado at Boulder (United States)
Christopher N. Bowman, Univ. of Colorado at Boulder (United States)
Robert R. McLeod, Univ. of Colorado at Boulder (United States)

Published in SPIE Proceedings Vol. 8097:
Optical Trapping and Optical Micromanipulation VIII
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

© SPIE. Terms of Use
Back to Top